Fractal characterizations of MeV ion treated CaF2 thin films

What is it about?

The results of this study show that ion irradiation of CaF2 thin films can lead to the formation of self-affine fractals on their surfaces. The fractal dimension of the surface increases with increasing fluence of the irradiation. The study provides valuable insights into the surface topography and roughness of the CaF2 thin films after ion irradiation. The characterization of the surface roughness in terms of fractal analysis provides a more quantitative and comprehensive understanding of the effects of ion irradiation on the surface morphology of the material. The results of this study can be useful for a range of applications, such as understanding the effects of radiation on materials, and for designing materials with specific surface properties.

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