What is it about?
Semiconductor devices working properly under radiation conditions are needed for robots or sensors working for the decommissioning of nuclear facilities, or used in space with long term reliability. We investigate degradation properties of Silicon Carbide Junction Field Effect Transistors (SiC JFETs), which are expected as radiation harder than common Si transistors. Extremely high dose irradiation up to 17 MGy is performed to understand degradation behavior and underlying mechanisms more clearly.
Featured Image
Photo by Vishnu Mohanan on Unsplash
Why is it important?
Although SiC JFETs have been thought to be radiation hard, their degradation behavior by irradiation and underlying mechanism have not been clearly understood. Due to extremely high dose gamma-rays irradiation up to 17 MGy, we find that 1) hysteresis in electrical characteristics, and 2) it is attributed to capture/release of carries at crystal defects generated by displacement damage by irradiation. The knowledge would be helpful for development of radiation harder SiC devices with higher reliability.
Perspectives
I am relieved that our collaborative research project was summarized. I hope this research is helpful for understanding how SiC device will be degraded after extremely high dose gamma-rays irradiation. I believe that knowledge of this study would also be helpful for development of other SiC or novel devices working under radiation conditions, including nuclear facilities, space environment or clinical use.
takeyama akinori
National Institutes for Quantum Science and Technology
Read the Original
This page is a summary of: Threshold voltage instability and hysteresis in gamma-rays irradiated 4H-SiC junction field effect transistors, Journal of Applied Physics, June 2022, American Institute of Physics,
DOI: 10.1063/5.0095841.
You can read the full text:
Contributors
The following have contributed to this page
