What is it about?
Electromagnetic waves that bounce around a resonant cavity tens of thousands of times are very sensitive to small changes in the cavity. So by measuring the properties of substrates with and without the film we can "see" films that are thousands of times thinner than the wavelength of the electromagnetic field in the cavity.
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Why is it important?
This technique, which we pursue from 100-500 GHz, has important applications in condensed matter physics, for example in characterizing thin film solar cells.
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This page is a summary of: A system for measuring complex dielectric properties of thin films at submillimeter wavelengths using an open hemispherical cavity and a vector network analyzer, Review of Scientific Instruments, August 2013, American Institute of Physics,
DOI: 10.1063/1.4816828.
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