X-ray scattering study of hydrogen implantation in silicon

Nicolas Sousbie, Luciana Capello, Joël Eymery, François Rieutord, Chrystelle Lagahe
  • Journal of Applied Physics, May 2006, American Institute of Physics
  • DOI: 10.1063/1.2198928

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http://dx.doi.org/10.1063/1.2198928

The following have contributed to this page: Dr Joel Eymery