Grazing incidence x-ray scattering investigation of Si surface patterned with buried dislocation networks

F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari, F. Fournel
  • Applied Physics Letters, April 2003, American Institute of Physics
  • DOI: 10.1063/1.1568545

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr Joel Eymery