Determination of the concentration of hot-carrier-induced bulk defects in laser-recrystallized polysilicon thin film transistors

T. M. Brown, P. Migliorato
  • Frontiers in Human Neuroscience, January 2000, American Institute of Physics
  • DOI: 10.1063/1.125926

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http://dx.doi.org/10.1063/1.125926

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