X-ray reflectivity of ultrathin twist-bonded silicon wafers

J. Eymery, F. Fournel, F. Rieutord, D. Buttard, H. Moriceau, B. Aspar
  • Applied Physics Letters, November 1999, American Institute of Physics
  • DOI: 10.1063/1.125371

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The following have contributed to this page: Dr Joel Eymery