Novel charge integrating pulsed I(V) technique: A measurement of Fowler–Nordheim currents through thin SiO2 films

  • J. C. Poler, W. S. Woodward, E. A. Irene
  • Review of Scientific Instruments, March 1993, American Institute of Physics
  • DOI: 10.1063/1.1144159

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http://dx.doi.org/10.1063/1.1144159

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