What is it about?

We used a microscope consisting of a sub-micron metallic tip to detect single electron charge transitions in a nanoscale device. The microscope tip can be scanned across a complex device, potentially allowing rapid screening of semiconductor quantum devices. The paper examines a specific radio frequency mode of charge detection.

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Why is it important?

We demonstrated single charge detection with a bandwidth and sensitivity comparable to state-of-the-art results using an agile scanning gate microscope.


I am excited for my group members who pulled off a very complicated experiment with a custom-made milli-Kelvin temperature scanning gate microscope. The measurement performance is exceptional and the measurement approach paves the way for future experiments in mesoscopic physics.

Jason Petta
University of California Los Angeles

Read the Original

This page is a summary of: Dispersive readout of a silicon quantum device using an atomic force microscope-based rf gate sensor, Applied Physics Letters, August 2023, American Institute of Physics,
DOI: 10.1063/5.0158196.
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