What is it about?
We used a microscope consisting of a sub-micron metallic tip to detect single electron charge transitions in a nanoscale device. The microscope tip can be scanned across a complex device, potentially allowing rapid screening of semiconductor quantum devices. The paper examines a specific radio frequency mode of charge detection.
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Why is it important?
We demonstrated single charge detection with a bandwidth and sensitivity comparable to state-of-the-art results using an agile scanning gate microscope.
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Read the Original
This page is a summary of: Dispersive readout of a silicon quantum device using an atomic force microscope-based rf gate sensor, Applied Physics Letters, August 2023, American Institute of Physics,
DOI: 10.1063/5.0158196.
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