Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

S. N. Piramanayagam, M. Ranjbar, E. L. Tan, H. K. Tan, R. Sbiaa, T. C. Chong
  • Journal of Applied Physics, January 2011, American Institute of Physics
  • DOI: 10.1063/1.3551733

Magnetic characterization - Magnetic Force Microscopy

What is it about?

We propose a new method to improve the resolution of magnetic force microscopy. The idea for the improvement is borrowed from perpendicular recording media technology.

The following have contributed to this page: SN Piramanayagam