Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropyS. N. Piramanayagam, M. Ranjbar, E. L. Tan, H. K. Tan, R. Sbiaa, T. C. Chong
- Journal of Applied Physics, January 2011, American Institute of Physics
- DOI: 10.1063/1.3551733
Magnetic characterization - Magnetic Force Microscopy
What is it about?
We propose a new method to improve the resolution of magnetic force microscopy. The idea for the improvement is borrowed from perpendicular recording media technology.