Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Lorenzo Mancini, Nooshin Amirifar, Deodatta Shinde, Ivan Blum, Matthieu Gilbert, Angela Vella, François Vurpillot, Williams Lefebvre, Rodrigue Lardé, Etienne Talbot, Philippe Pareige, Xavier Portier, Ahmed Ziani, Christian Davesnne, Christophe Durand, Joël Eymery, Raphaël Butté, Jean-François Carlin, Nicolas Grandjean, Lorenzo Rigutti
  • The Journal of Physical Chemistry C, October 2014, American Chemical Society (ACS)
  • DOI: 10.1021/jp5071264

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http://dx.doi.org/10.1021/jp5071264

The following have contributed to this page: Dr Joel Eymery