Optoelectronic Properties of InAlN/GaN Distributed Bragg Reflector Heterostructure Examined by Valence Electron Energy Loss Spectroscopy

A. Eljarrat, S. Estradé, Ž. Gačević, S. Fernández-Garrido, E. Calleja, C. Magén, F. Peiró
  • Microscopy and Microanalysis, October 2012, Cambridge University Press
  • DOI: 10.1017/s1431927612001328

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http://dx.doi.org/10.1017/s1431927612001328

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