All Stories

  1. EELS tomography in multiferroic nanocomposites: from spectrum images to the spectrum volume
  2. Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS
  3. Insight into the Compositional and Structural Nano Features of AlN/GaN DBRs by EELS-HAADF
  4. Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS
  5. EEL spectroscopic tomography: Towards a new dimension in nanomaterials analysis
  6. Optoelectronic Properties of InAlN/GaN Distributed Bragg Reflector Heterostructure Examined by Valence Electron Energy Loss Spectroscopy