Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces

D Buttard, J Eymery, F Rieutord, F Fournel, D Lübbert, T Baumbach, H Moriceau
  • Physica B Condensed Matter, June 2000, Elsevier
  • DOI: 10.1016/s0921-4526(99)01900-6

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http://dx.doi.org/10.1016/s0921-4526(99)01900-6

The following have contributed to this page: Dr Joel Eymery