STM study of ultra-thin (<2 nm) silicon oxide

P. Gentile, J. Eymery, F. Gustavo, P. Mur, J.M. Hartmann, P. Besson
  • Journal of Non-Crystalline Solids, July 2003, Elsevier
  • DOI: 10.1016/s0022-3093(03)00198-4

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http://dx.doi.org/10.1016/s0022-3093(03)00198-4

The following have contributed to this page: Dr Joel Eymery