STM study of ultra-thin (<2 nm) silicon oxide

P. Gentile, J. Eymery, F. Gustavo, P. Mur, J.M. Hartmann, P. Besson
  • Journal of Non-Crystalline Solids, July 2003, Elsevier
  • DOI: 10.1016/s0022-3093(03)00198-4

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr Joel Eymery