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This page is a summary of: Combined in-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy study of the effect of deposition pressure and substrate bias on the electrical properties and composition of Ga-doped ZnO thin films grown by magnetr..., Thin Solid Films, November 2018, Elsevier,
DOI: 10.1016/j.tsf.2018.09.004.
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