Electrical and diffraction characterization of short and narrow MOSFETs on fully depleted strained silicon-on-insulator (sSOI)

S. Baudot, F. Andrieu, O. Faynot, J. Eymery
  • Solid-State Electronics, September 2010, Elsevier
  • DOI: 10.1016/j.sse.2010.04.032

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http://dx.doi.org/10.1016/j.sse.2010.04.032

The following have contributed to this page: Dr Joel Eymery