Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Electrical and structural characterization of ion implanted GaN, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, May 2009, Elsevier,
DOI: 10.1016/j.nimb.2009.01.091.
You can read the full text:
Contributors
The following have contributed to this page
