Diamond layout style impact on SOI MOSFET in high temperature environment

  • Salvador Pinillos Gimenez, Egon Henrique Salerno Galembeck, Christian Renaux, Denis Flandre
  • Microelectronics Reliability, April 2015, Elsevier
  • DOI: 10.1016/j.microrel.2015.02.015

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http://dx.doi.org/10.1016/j.microrel.2015.02.015

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