Electronic circuit reliability modeling

Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
  • Microelectronics Reliability, December 2006, Elsevier
  • DOI: 10.1016/j.microrel.2005.12.004

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Joseph Bernstein