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This page is a summary of: Mechanism and characterizations studies of resistive switching effects on a thin FeOx-transition layer of the Ti/TiN/SiO2/FeOx/FePt structure by thermal annealing treatments, Materials Chemistry and Physics, December 2011, Elsevier,
DOI: 10.1016/j.matchemphys.2011.09.037.
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