What is it about?

Bulk-sensitive X-ray resonant magnetic scattering (XRMS) is utilized to quantify the magnetic moments in a Fe/V superlattice. The induced magnetic moments in nonmagnetic V are anti-ferromagnetic relative to Fe, mostly confined to the interface layer and decay fast with distance from the interface. The results provide new insight into interface magnetism by taking advantage of the X-ray depth sensitivity under resonant conditions.

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Why is it important?

There is a quest for improved applications for magnetic data storage and magnetic sensors. Therefore it is necessary to study the fundamental mechanism for the magnetic coupling in superlattices and quantify the magnetic profile. X-ray spectroscopies are both bulk sensitive and element selective. The standard X-ray magnetic circular dichroism (XMCD) method has a limited probe depth of only ~15Å and is not useful when capping layers are used to prevent surface oxidation. Fe/V superlattices of different thicknesses are commonly used as model systems to study magnetic effects.


X-ray spectroscopy is very useful to study internal bulk properties of materials such as magnetism and optical constants. The refractive index of superlattice mirrors can be studied by Bragg reflection: Determination of the refractive index at soft X-ray resonances: M. Magnuson et al.; J. Electr. Spec. 137, 519 (2004). The related method, resonant inelastic X-ray scattering (RIXS) can also be applied to investigate magnetic materials: Large magnetic circular dichroism in resonant inelastic x-ray scattering at the Mn L-edge of Mn-Zn ferrite; M. Magnuson et al.; Phys. Rev. B., 74, 172409 (2006). M. Magnuson; J. Magn. Magn. Phen. 422, 362 (2017)

Associate Prof. Martin Magnuson
Department of Physics, Chemistry and Biology (IFM)

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This page is a summary of: Induced magnetism at the interfaces of a Fe/V superlattice investigated by resonant magnetic x-ray scattering, Journal of Magnetism and Magnetic Materials, January 2017, Elsevier, DOI: 10.1016/j.jmmm.2016.09.009.
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