Growth of Ge on Si(001) studied in situ by grazing incidence small angle X-ray scattering

F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari
  • Journal of Crystal Growth, February 2005, Elsevier
  • DOI: 10.1016/j.jcrysgro.2004.11.246

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http://dx.doi.org/10.1016/j.jcrysgro.2004.11.246

The following have contributed to this page: Dr Joel Eymery