Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy

Steven M. Reddy, Arie van Riessen, David W. Saxey, Tim E. Johnson, William D.A. Rickard, Denis Fougerouse, Sebastian Fischer, Ty J. Prosa, Katherine P. Rice, David A. Reinhard, Yimeng Chen, David Olson
  • Geochimica et Cosmochimica Acta, December 2016, Elsevier
  • DOI: 10.1016/j.gca.2016.09.019

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http://dx.doi.org/10.1016/j.gca.2016.09.019

The following have contributed to this page: Dr Tim E Johnson