An Auger depth profile analysis of a sputtered Fe-Ti multilayer structure

J. Eymery, C. Senillou, J.C. Joud, A. Chamberod
  • Applied Surface Science, February 1991, Elsevier
  • DOI: 10.1016/0169-4332(91)90027-h

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http://dx.doi.org/10.1016/0169-4332(91)90027-h

The following have contributed to this page: Dr Joel Eymery