In situ characterization of rare earth-CdTe heterostructures by ion beam analysis

P Gros, G Fiat, D Brun, B Daudin, J Eymery, E Ligeon, A.C Chami
  • Thin Solid Films, September 1994, Elsevier
  • DOI: 10.1016/0040-6090(94)90773-0

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The following have contributed to this page: Dr Joel Eymery