Extended synchrotron X-ray reflectivity study of a Sm-based layer buried into CdTe(001)

N. Boudet, J. Eymery, G. Renaud, J.L. Rouvière, J.Y. Veuillen, D. Brun, B. Daudin
  • Surface Science, April 1995, Elsevier
  • DOI: 10.1016/0039-6028(95)00034-8

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http://dx.doi.org/10.1016/0039-6028(95)00034-8

The following have contributed to this page: Dr Joel Eymery