What is it about?
The objective of this study is to propose a complete reliability model that predicts the cycle life of all-solid-state thin film microbatteries in application conditions, integrating a large number of operational parameters as input data, including the expected failure rate as a statistical feature. These microbatteries are intended to a wide range of new markets and applications: smart cards, battery-assisted RFID tags, wireless sensor networks, and multiple advanced healthcare applications
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Why is it important?
Because of their recent development, all-solid-state microbattery technologies have been the topic of only few reliability studies, which mostly deal with operating characteristics, failure mechanisms,and capacity loss after a reduced number of cycles
Read the Original
This page is a summary of: Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries, Microelectronics Reliability, February 2019, Elsevier, DOI: 10.1016/j.microrel.2019.01.003.
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