Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience

  • Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit B. Kleeberger, Michael A. Kochte, Johannes M. Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi B. Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich
  • Microelectronics Reliability, June 2014, Elsevier
  • DOI: 10.1016/j.microrel.2013.12.012

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http://dx.doi.org/10.1016/j.microrel.2013.12.012

The following have contributed to this page: Dr Daniel Mueller-Gritschneder