The comparison scanning electron microscope first experiments in forensic application

  • R. Goebel, K. D. Gross, H. Katterwe, W. Kammrath
  • Scanning, January 1980, Wiley
  • DOI: 10.1002/sca.4950030310

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http://dx.doi.org/10.1002/sca.4950030310

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