All Stories

  1. A Hybrid Weakly Supervised Approach for enhanced High-Precision SEM Defect Segmentation in Nanoscale Semiconductor Manufacturing

    Article • ACM Transactions on Design Automation of Electronic Systems, December 2025, ACM (Association for Computing Machinery)

    Yibo Qiao, yining chen

  2. DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture

    Article • January 2025, ACM (Association for Computing Machinery)

    yining chen

  3. SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image

    Article • October 2024, ACM (Association for Computing Machinery)

    yining chen, Yuqi Jiang

  4. Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation

    Article • June 2024, ACM (Association for Computing Machinery)

    yining chen, Yibo Qiao

  5. A Method of Predicting the Deposited Film Thickness in IC Fabrication Based on Stacking Ensemble Learning

    Article • December 2023, ACM (Association for Computing Machinery)

    yining chen