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  1. A Hybrid Weakly Supervised Approach for enhanced High-Precision SEM Defect Segmentation in Nanoscale Semiconductor Manufacturing

    Article • ACM Transactions on Design Automation of Electronic Systems, December 2025, ACM (Association for Computing Machinery)

    Yibo Qiao, yining chen

  2. Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation

    Article • June 2024, ACM (Association for Computing Machinery)

    yining chen, Yibo Qiao