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  1. Gate Oxide Reliability of SiC MOSFETs and Capacitors Fabricated on 150mm Wafers

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Satyaki Ganguly

  2. Avalanche Ruggedness Characterization of 10 kV 4H-SiC MOSFETs

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Ashish Kumar, Satyaki Ganguly