All Stories

  1. Study on Microgratings Using Imaging, Spectroscopic, and Fourier Lens Scatterometry

    Article • Journal of Micro and Nano-Manufacturing, June 2017, ASME International

    Dr Pierre M Boher

  2. 69-3: New Multiplexing Method for Quasi Static and Artefact Free Color LED Matrix Displays

    Article • SID Symposium Digest of Technical Papers, May 2017, Wiley

    Dr Pierre M Boher

  3. New generation of Fourier optics viewing angle measurement systems

    Article • February 2017, SPIE

    Dr Pierre M Boher

  4. Polarimetric multispectral bidirectional reflectance distribution function measurements using a Fourier transform instrument

    Article • Electronic Imaging, January 2017, Society for Imaging Science & Technology

    Dr Pierre M Boher

  5. 72-3: Optical Characterization of a Transparent LCD Using a Fourier-Optics Multispectral Viewing-Angle System

    Article • SID Symposium Digest of Technical Papers, May 2016, Wiley

    Dr Pierre M Boher

  6. 36-3: Emissive and Reflective Properties of Vehicle Displays Measured using Fourier-Optics Viewing-Angle Instruments

    Article • SID Symposium Digest of Technical Papers, May 2016, Wiley

    Dr Pierre M Boher

  7. Emissive and reflective properties of curved displays in relation to image quality

    Article • March 2016, SPIE

    Dr Pierre M Boher

  8. Multispectral BRDF measurements on anisotropic samples: application to metallic surfaces and OLED displays

    Article • Electronic Imaging, February 2016, Society for Imaging Science & Technology

    Dr Pierre M Boher

  9. Alignment-free characterization of 2D gratings

    Article • Applied Optics, January 2016, Optical Society of America (OSA)

    Dr Pierre M Boher

  10. Fast Spectral BRDF & BTDF Measurements for Characterization of Displays and Components

    Article • IEICE Transactions on Electronics, January 2016, Institute of Electronics, Information and Communications Engineers (IEICE)

    Dr Pierre M Boher

  11. Optical characterization of OLED displays

    Article • Journal of the Society for Information Display, September 2015, Wiley

    Dr Pierre M Boher

  12. Paper No S11.2: Spectral BRDF and BTDF of Display Optical Components

    Article • SID Symposium Digest of Technical Papers, September 2015, Wiley

    Dr Pierre M Boher

  13. Paper No S13.3: Optical Characterization of OLED Displays

    Article • SID Symposium Digest of Technical Papers, September 2015, Wiley

    Dr Pierre M Boher

  14. 42.4: How to Perform Viewing Angle Measurements on Curved Displays

    Article • SID Symposium Digest of Technical Papers, June 2015, Wiley

    Dr Pierre M Boher

  15. P-67: Viewing Angle and Imaging Multispectral Characterization of OLED Displays

    Article • SID Symposium Digest of Technical Papers, June 2015, Wiley

    Dr Pierre M Boher

  16. In-depth assessment of organic LED display quality

    Article • SPIE Newsroom, April 2015, SPIE

    Dr Pierre M Boher

  17. New generation of Fourier optics instruments for fast multispectral BRDF characterization

    Article • March 2015, SPIE

    Dr Pierre M Boher

  18. Viewing angle and imaging multispectral analysis of OLED display light emission

    Article • March 2015, SPIE

    Dr Pierre M Boher

  19. 41.4: New Strategy for Characterization of Multi-view Auto-stereoscopic Displays using Fourier Optics Viewing Angle Instrument

    Article • SID Symposium Digest of Technical Papers, June 2014, Wiley

    Dr Pierre M Boher

  20. Viewing Angle and Imaging Polarization Analysis of Liquid Crystal Displays and Their Components

    Article • Molecular Crystals and Liquid Crystals, May 2014, Taylor & Francis

    Dr Pierre M Boher

  21. Practical resolution requirements of measurement instruments for precise characterization of autostereoscopic 3D displays

    Article • March 2014, SPIE

    Dr Pierre M Boher

  22. Optical characterization of auto-stereoscopic 3D displays: interest of the resolution and comparison to human eye properties

    Article • February 2014, SPIE

    Dr Pierre M Boher

  23. Paper No 14.1: Imaging Colorimeter for Color Calibration of Phone and Tablet Displays

    Article • SID Symposium Digest of Technical Papers, September 2013, Wiley

    Dr Pierre M Boher

  24. Paper No 14.3: Ultra-Large Field of View and High-Magnification Imaging Video Colorimeter

    Article • SID Symposium Digest of Technical Papers, September 2013, Wiley

    Dr Pierre M Boher

  25. P.44: Display Aspect Simulation using Measured Emissive and Reflective Display Imperfections

    Article • SID Symposium Digest of Technical Papers, June 2013, Wiley

    Dr Pierre M Boher

  26. Optical characterization of different types of 3D displays

    Article • February 2012, SPIE

    Dr Pierre M Boher

  27. Full optical characterization of auto-stereoscopic 3D displays using local viewing angle and imaging measurements

    Article • February 2012, SPIE

    Dr Pierre M Boher

  28. Optical characterization of 3D displays

    Article • SPIE Newsroom, January 2012, SPIE

    Dr Pierre M Boher

  29. Color display evaluationvs. viewing angle usingL*a*b* color space and Fourier-optics measurements

    Article • Journal of Information Display, December 2011, Taylor & Francis

    Dr Pierre M Boher

  30. 70.3: Precise Evaluation of the Colorimetric Properties of Displays Versus Viewing Angle using Fourier Optics

    Article • SID Symposium Digest of Technical Papers, June 2011, Wiley

    Dr Pierre M Boher

  31. 14.3: Grey Level Crosstalk and Temporal Synchronization of Different Shutter Glass 3D TVs

    Article • SID Symposium Digest of Technical Papers, June 2011, Wiley

    Dr Pierre M Boher

  32. Characterization of one time‐sequential stereoscopic 3d display ‐ Part I: Temporal analysis ‐

    Article • Journal of Information Display, June 2010, Taylor & Francis

    Dr Pierre M Boher

  33. Characterization of one time‐sequential stereoscopic 3d display ‐ Part II: Quick characterization using homogeneity measurements ‐

    Article • Journal of Information Display, June 2010, Taylor & Francis

    Dr Pierre M Boher

  34. Imaging polarization for characterization of polarization based stereoscopic 3D displays

    Article • February 2010, SPIE

    Dr Pierre M Boher

  35. Multispectral polarization viewing angle analysis of circular polarized stereoscopic 3D displays

    Article • February 2010, SPIE

    Dr Pierre M Boher

  36. 23.1: Viewing Angle and Imaging Polarization Analysis of Polarization Based Stereoscopic 3D Displays

    Article • SID Symposium Digest of Technical Papers, January 2010, Wiley

    Dr Pierre M Boher

  37. 17.4: Comprehensive Survey on Viewing Angle Measurement Devices: A Theoretical Study

    Article • SID Symposium Digest of Technical Papers, January 2009, Wiley

    Dr Pierre M Boher

  38. 11.2: Distinguished Paper: VCMaster3D: A New Fourier Optics Viewing Angle Instrument for Characterization of Autostereoscopic 3D Displays.

    Article • SID Symposium Digest of Technical Papers, January 2009, Wiley

    Dr Pierre M Boher

  39. P-68: High-Visibility 2D/3D LCD with HDDP Arrangement and Its Evaluation Results Using Fourier Optics Instrument

    Article • SID Symposium Digest of Technical Papers, January 2009, Wiley

    Dr Pierre M Boher

  40. P-89: New Multispectral Fourier Optics Viewing Angle Instrument for Full Characterization of LCDs and their Components

    Article • SID Symposium Digest of Technical Papers, January 2008, Wiley

    Dr Pierre M Boher

  41. 26.4: Relationship between LCD Response Time and MPRT

    Article • SID Symposium Digest of Technical Papers, May 2007, Wiley

    Dr Pierre M Boher

  42. Robust sub-50-nm CD control by a fast-goniometric scatterometry technique

    Article • March 2007, SPIE

    Dr Pierre M Boher

  43. Angle of view polarization characterization of liquid crystal displays and their components

    Article • Journal of Information Display, January 2007, Taylor & Francis

    Dr Pierre M Boher

  44. P-74: Calibration of a Fourier-Optics based Measurement System

    Article • SID Symposium Digest of Technical Papers, January 2006, Wiley

    Dr Pierre M Boher

  45. P-81: Image Sticking Cartography on PDP TV: A New Quantitative Measurement

    Article • SID Symposium Digest of Technical Papers, January 2005, Wiley

    Dr Pierre M Boher

  46. Rapid photo-goniometric technique for LED emission characterization

    Article • October 2004, SPIE

    Dr Pierre M Boher

  47. Light-scattered measurements using Fourier optics: a new tool for surface characterization

    Article • September 2004, SPIE

    Dr Pierre M Boher

  48. Innovative rapid photogoniometry method for CD metrology

    Article • May 2004, SPIE

    Dr Pierre M Boher

  49. A new analysis strategy for CD metrology using rapid photo goniometry method

    Article • May 2004, SPIE

    Dr Pierre M Boher

  50. P-58: Imaging Polarization Interferometer for Flat Panel Display Characterization

    Article • SID Symposium Digest of Technical Papers, January 2004, Wiley

    Dr Pierre M Boher

  51. The French R&D program on EUV lithography : PREUVE

    Article • June 2003, SPIE

    Dr Pierre M Boher

  52. High-k dielectric characterization by VUV spectroscopic ellipsometry and X-ray reflection

    Article • January 2003, American Institute of Physics

    Dr Pierre M Boher

  53. New infrared spectroscopic ellipsometer for low-k dielectric characterization

    Article • January 2003, American Institute of Physics

    Dr Pierre M Boher

  54. Precise and accurate characterization of DUV and V-UV phase shifting mask materials by combined V-UV spectroscopic ellipsometry and x-ray reflectometry

    Article • December 2002, SPIE

    Dr Pierre M Boher

  55. Characterization of optics and masks for the EUV lithography

    Article • Microelectronic Engineering, July 2002, Elsevier

    Dr Pierre M Boher

  56. Characterization of ultrathin gate dielectrics by grazing X-ray reflectance and VUV spectroscopic ellipsometry on the same instrument

    Article • Journal of Non-Crystalline Solids, May 2002, Elsevier

    Dr Pierre M Boher

  57. Characterization of CNx films deposited by pulsed laser ablation using spectroscopic ellipsometry

    Article • Surface and Coatings Technology, March 2002, Elsevier

    Dr Pierre M Boher

  58. Combined metrology including VUV spectroscopic ellipsometer and grazing x-ray reflectance for precise characterization of thin films and multilayers at 157 nm

    Article • December 2001, SPIE

    Dr Pierre M Boher

  59. IR spectroscopic ellipsometry for industrial characterization of semiconductors

    Article • December 2001, SPIE

    Dr Pierre M Boher

  60. Feasibility and applicability of integrated metrology using spectroscopic ellipsometry in a cluster tool

    Article • December 2001, SPIE

    Dr Pierre M Boher

  61. Phase-shifting interference microscope for the characterization of metallic interconnections of flat panel displays

    Article • October 2001, SPIE

    Dr Pierre M Boher

  62. Combined metrology including VUV spectroscopic ellipsometry and grazing x-ray reflectance for precise characterization of thin films and multilayers at 157 nm

    Article • August 2001, SPIE

    Dr Pierre M Boher

  63. New instrument to characterize materials and optics for 157-nm lithography

    Article • April 2001, SPIE

    Dr Pierre M Boher

  64. Characterization of ultrathin gate dielectrics using combined grazing x-ray reflectance and spectroscopic ellipsometry

    Article • April 2001, SPIE

    Dr Pierre M Boher

  65. New purged UV spectroscopic ellipsometer to characterize thin films and multilayers at 157 nm

    Article • November 2000, SPIE

    Dr Pierre M Boher

  66. Feasibility and applicability of integrated metrology using spectroscopic ellipsometry in a cluster tool

    Article • August 2000, SPIE

    Dr Pierre M Boher

  67. New purged UV spectroscopic ellipsometer to characterize thin films and multilayers at 157 nm

    Article • June 2000, SPIE

    Dr Pierre M Boher

  68. Precise Characterization of Resists and Thin Gate Dielectrics in the VUV Range for 157nm Lithography

    Article • MRS Proceedings, January 2000, Cambridge University Press

    Dr Pierre M Boher

  69. SOPRA SE300: a new tool for high accuracy characterization of multilayer structures

    Article • Microelectronic Engineering, July 1999, Elsevier

    Dr Pierre M Boher

  70. High-accuracy characterization of antireflective coatings and photoresists by spectroscopic ellipsometry: a new tool for 300-mm wafer technology

    Article • June 1999, SPIE

    Dr Pierre M Boher

  71. New method for determination of the photoresist Dill parameters using spectroscopic ellipsometry

    Article • June 1999, SPIE

    Dr Pierre M Boher

  72. New versatile system for characterization of antireflective coatings using combined spectroscopic ellipsometry and grazing x-ray reflectance

    Article • April 1999, SPIE

    Dr Pierre M Boher

  73. New method for determination of the photoresist Dill parameters using spectroscopic ellipsometry

    Article • April 1999, SPIE

    Dr Pierre M Boher

  74. High-accuracy characterization of antireflective coatings and photoresists by spectroscopic ellipsometry: a new tool for 300-mm-wafer technology

    Article • April 1999, SPIE

    Dr Pierre M Boher

  75. Precise characterization of ultrathin nitride/oxide gate dielectrics by grazing x-ray reflectance and spectroscopic ellipsometry

    Article • MRS Proceedings, January 1999, Cambridge University Press

    Dr Pierre M Boher

  76. A New Purged UV Spectroscopic Ellipsometer to characterize 157nm nanolithographic materials

    Article • MRS Proceedings, January 1999, Cambridge University Press

    Dr Pierre M Boher

  77. A new process to manufacture thin SiGe and SiGeC epitaxial films on silicon by ion implantation and excimer laser annealing

    Article • Applied Surface Science, January 1999, Elsevier

    Dr Pierre M Boher

  78. New process for manufacturing thin SiGe and SiGeC epitaxial films on silicon by ion implantation and excimer laser annealing

    Article • September 1998, SPIE

    Dr Pierre M Boher

  79. Real-time spectroscopic reflectometer for end-point detection on multichamber deposition processes

    Article • September 1998, SPIE

    Dr Pierre M Boher

  80. SOPRA SE3000: a new tool for high-accuracy characterization of multilayer structures on very small spot size

    Article • September 1998, SPIE

    Dr Pierre M Boher

  81. Growth of pseudomorphic Si1−yCy and Si1−x−yGexCy alloy layers on < 100 > Si by ion implantation and pulsed excimer laser induced epitaxy

    Article • Materials Chemistry and Physics, July 1998, Elsevier

    Dr Pierre M Boher

  82. Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry

    Article • Thin Solid Films, April 1998, Elsevier

    Dr Pierre M Boher

  83. Combined characterization of conductive materials by infrared spectroscopic ellipsometry and grazing X-ray reflectance

    Article • Thin Solid Films, April 1998, Elsevier

    Dr Pierre M Boher

  84. Ti/TiN multilayers for hard coatings applications: in-situ characterization by real time spectroscopic ellipsometry

    Article • Surface and Coatings Technology, March 1998, Elsevier

    Dr Pierre M Boher

  85. Precise measurement of ARC optical indices in the deep-UV range by variable-angle spectroscopic ellipsometry

    Article • July 1997, SPIE

    Dr Pierre M Boher

  86. Growth of Si1-yCy/Si and Si1-x-yGexCy/Si heterostructures by ion implantation and pulsed excimer laser-induced epitaxy

    Article • May 1997, SPIE

    Dr Pierre M Boher

  87. Fine characterization of ITO layers by spectroscopic ellipsometry

    Article • August 1996, SPIE

    Dr Pierre M Boher

  88. Single-shot excimer laser annealing of PECVD amorphous silicon

    Article • August 1996, SPIE

    Dr Pierre M Boher

  89. Characterization of laser-annealed polysilicon by spectroscopic ellipsometry and comparison to other techniques

    Article • August 1996, SPIE

    Dr Pierre M Boher

  90. Characterization of resists and antireflective coatings by spectroscopic ellipsometry in the UV and deep-UV range

    Article • June 1996, SPIE

    Dr Pierre M Boher

  91. Single shot excimer laser annealing of amorphous silicon for AMLCD

    Article • Applied Surface Science, April 1996, Elsevier

    Dr Pierre M Boher

  92. In situ spectroscopic ellipsometry: present status and future needs for thin film characterisation and process control

    Article • Materials Science and Engineering B, February 1996, Elsevier

    Dr Pierre M Boher

  93. Single shot excimer laser annealing of amorphous silicon for AMLCD

    Article • January 1996, Elsevier

    Dr Pierre M Boher

  94. In situ spectroscopic ellipsometry: present status and future needs for thin film characterisation and process control

    Article • January 1996, Elsevier

    Dr Pierre M Boher

  95. Spectroscopic ellipsometry for Si(1 − x)Gex characterization: comparison with other experimental techniques

    Article • January 1996, Elsevier

    Dr Pierre M Boher

  96. Spectroscopic ellipsometry applied to the determination of an ion implantation depth profile

    Article • January 1996, Elsevier

    Dr Pierre M Boher

  97. In-situ Real Time Spectroscopic Ellipsometry Applied to the Surface Monitoring of Semiconductors

    Article • MRS Proceedings, January 1996, Cambridge University Press

    Dr Pierre M Boher

  98. Spectroscopic ellipsometry for Si(1 − x)Gex characterization: comparison with other experimental techniques

    Article • Journal of Crystal Growth, December 1995, Elsevier

    Dr Pierre M Boher

  99. Magnetic and magneto-optical properties of Tb/Fe multilayers

    Article • Journal of Magnetism and Magnetic Materials, September 1994, Elsevier

    Dr Pierre M Boher

  100. Tb/Fe multilayers: A study by conversion electron Mössbauer spectrometry and polar Kerr effect

    Article • Journal of Magnetism and Magnetic Materials, March 1993, Elsevier

    Dr Pierre M Boher

  101. Ni/C and Rh/C multilayers for soft x-ray optics: influence of the deposition conditions on the nanostructure

    Article • January 1993, SPIE

    Dr Pierre M Boher

  102. Fabrication and performance of linear multilayer gratings in the 44-130 angstrom wavelength range

    Article • January 1993, SPIE

    Dr Pierre M Boher

  103. Tb/Fe multilayered films studied by conversion electron Mössbauer spectrometry and Kerr effect

    Article • Journal de Physique IV (Proceedings), December 1992, EDP Sciences

    Dr Pierre M Boher

  104. rf-sputtered Fe/Ge multilayers for neutron-polarizing monochromators

    Article • November 1992, SPIE

    Dr Pierre M Boher

  105. Low d-spacing titanium-based multilayers for neutrons

    Article • November 1992, SPIE

    Dr Pierre M Boher

  106. Anisotropic differential magnetoresistance of Cu/Co(100) multilayers

    Article • Journal of Applied Physics, November 1992, American Institute of Physics

    Dr Pierre M Boher

  107. Enhanced differential magnetoresistance of Cu/Co (100) multilayers

    Article • Journal of Magnetism and Magnetic Materials, February 1992, Elsevier

    Dr Pierre M Boher

  108. Magneto-optical properties of diode rf-sputtered Tb/Fe multilayers: influence of the stack parameters.

    Article • Journal of Magnetism and Magnetic Materials, February 1992, Elsevier

    Dr Pierre M Boher

  109. Magnesium-silicide-based multilayers for soft x-ray optics

    Article • January 1992, SPIE

    Dr Pierre M Boher

  110. Tungsten/boron nitride multilayers for XUV optical applications

    Article • January 1992, SPIE

    Dr Pierre M Boher

  111. Structural characteristics and performances of rf-sputtered Mo/Si and Co/Si multilayers for soft x-ray optics

    Article • January 1992, SPIE

    Dr Pierre M Boher

  112. Experimental study of Fe/C multilayer performance: effects of substrate quality and of x-ray irradiation

    Article • January 1992, SPIE

    Dr Pierre M Boher

  113. Structural and magneto‐optical properties of Tb/Fe and (Tb/Fe)/Si3N4multilayers

    Article • Journal of Applied Physics, April 1991, American Institute of Physics

    Dr Pierre M Boher

  114. Magnetic and structural properties of rf‐sputtered Co/Fe and Co/Cr multilayers

    Article • Journal of Applied Physics, April 1991, American Institute of Physics

    Dr Pierre M Boher

  115. Silicon/silicon oxide and silicon/silicon nitride multilayers for XUV optical applications

    Article • February 1991, SPIE

    Dr Pierre M Boher

  116. Soft magnetic properties of Fe/FeN multilayer films prepared by reactive diode rf sputtering

    Article • Journal of Magnetism and Magnetic Materials, February 1991, Elsevier

    Dr Pierre M Boher

  117. Comparative study of carbon and boron carbide spacing layers inside soft x-ray mirrors

    Article • January 1991, SPIE

    Dr Pierre M Boher

  118. Three materials soft x-ray mirrors: theory and application

    Article • January 1991, SPIE

    Dr Pierre M Boher

  119. Silicon/silicon oxide and silicon/silicon nitride multilayers for extreme ultraviolet

    Article • Optical Engineering, January 1991, SPIE

    Dr Pierre M Boher

  120. Grazing x‐ray reflection analysis of nanometric scale structures

    Article • Journal of Applied Physics, December 1990, American Institute of Physics

    Dr Pierre M Boher

  121. Manufacture and performances of rhodium/carbon multilayer x‐ray mirrors

    Article • Applied Physics Letters, August 1990, American Institute of Physics

    Dr Pierre M Boher

  122. Radio frequency sputtering of tungsten/tungsten nitride multilayers on GaAs

    Article • Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, March 1990, American Vacuum Society

    Dr Pierre M Boher

  123. Silicon nitride films prepared using a SiH4/NH3microwave multipolar plasma

    Article • Journal of Applied Physics, October 1989, American Institute of Physics

    Dr Pierre M Boher

  124. Interface analysis of sputtered W-C, Rh-C and Ni-C multilayers for soft X-ray applications

    Article • Thin Solid Films, August 1989, Elsevier

    Dr Pierre M Boher

  125. Diode r.f. sputtering of copper and copper oxide thin films and multilayers

    Article • Thin Solid Films, July 1989, Elsevier

    Dr Pierre M Boher

  126. Hydrogen and oxygen content of silicon nitride films prepared by multipolar plasma‐enhanced chemical vapor deposition

    Article • Applied Physics Letters, February 1989, American Institute of Physics

    Dr Pierre M Boher

  127. Influence of the Surface Layer Defects on the Conduction Mechanism in Semi-Insulating Gallium Arsenide

    Article • Materials Science Forum, January 1989, Trans Tech Publications

    Dr Pierre M Boher

  128. Metastable to Stable EL2 Regeneration via an 'Auger' Mechanism Induced by the Debye Tail

    Article • Materials Science Forum, January 1989, Trans Tech Publications

    Dr Pierre M Boher

  129. Physical parameters of GaInAs/Si3N4interface states obtained by the conductance method

    Article • Applied Physics Letters, September 1988, American Institute of Physics

    Dr Pierre M Boher

  130. Interactions between bombardment‐induced defects in GaAs

    Article • Applied Physics Letters, February 1987, American Institute of Physics

    Dr Pierre M Boher

  131. Electron Hopping between Bombardment Induced Defects in Gallium Arsenide

    Article • Materials Science Forum, January 1986, Trans Tech Publications

    Dr Pierre M Boher

  132. ChemInform Abstract: Neue Phase für das Bleimonoxid α-PbO bei tiefer Temperatur.

    Article • Chemischer Informationsdienst, June 1984, Wiley

    Dr Pierre M Boher

  133. Characterization of III-V periodic structures by spectroscopic ellipsometry and grazing X-ray reflectance

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Dr Pierre M Boher