What is it about?
Multispectral viewing angle and imaging characterization has been applied to different OLED displays. Angular dependence of the OLED emission is always complex because of their multilayer structure. Spectral information are also related to the geometry of Fabry-Perot like structure of each OLED. High resolution viewing angle measurements of different OLED displays are reported and compared. Multispectral viewing angle polarization properties are also reported. Imaging measurements allow to detect wavelength shift on the surface of the displays probably related to thickness non-uniformities. Local radiance fluctuations from one pixel to the other more related to driving problems due to the dispersion of the electric properties of the driving TFTs are also detected.
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Why is it important?
In spite of excellent viewing angle properties, OLED displays are not perfect due to the multilayer structure of these displays. The paper emphasises this problem and explain how to measure and analyse that sort of property.
Perspectives
Pierre Boher earned an Engineer degree at ECP, “Ecole Centrale des Arts et Manufactures” in 1982. He obtained his Ph.D. in material sciences in 1984 and his ability to research management at “University Pierre et Marie Curie” in 1991. He worked in the French Philips Laboratories during nine years on the deposition and characterization of very thin films and multilayers. R&D manager at SOPRA between 1995 and 2002, he developed different metrology tools for non-destructive characterization mainly for microelectronics. He joined ELDIM as R&D manager in 2003.
Dr Pierre M Boher
ELDIM
Read the Original
This page is a summary of: Optical characterization of OLED displays, Journal of the Society for Information Display, September 2015, Wiley,
DOI: 10.1002/jsid.369.
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