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  1. Evaluation of Effect of Mechanical Stress on Stacking Fault Expansion in 4H-SiC P-i-N Diode

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Kenji Hirohata, Johji Nishio

  2. Dynamics Analysis of Single Shockley Stacking Fault Expansion in 4H-SiC P-i-N Diode Based on Free Energy

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Kenji Hirohata, Johji Nishio