All Stories

  1. A numerical parameter study on the occurrence of bulk circulating flow in Si HMCz crystal growth
  2. Interaction of solid particles with a moving solidification front under microgravity conditions during the TEXUS56 and TEXUS58 sounding rocket missions – an experimental and theoretical study
  3. Impact of Inhomogeneous Offcut Angles of GaN Native Substrates on Lateral Current Modulation in AlGaN Barrier Layers
  4. Facet growth kinetics and diameter fluctuations in molten zone Si crystal growth
  5. Analysis of the High-Pressure High-Temperature (HPHT) growth of single crystal diamond
  6. Scalable Quantum Memory Nodes Using Nuclear Spins in Silicon Carbide
  7. Microstructure and Mechanical Properties of Hypereutectic Al-High Si Alloys up to 70 wt.% Si-Content Produced from Pre-Alloyed and Blended Powder via Laser Powder Bed Fusion
  8. Long-Term Stability of Novel Crucible Systems for the Growth of Oxygen-Free Czochralski Silicon Crystals
  9. Investigation of Facetted Growth in Heavily Doped Silicon Crystals Grown in Mirror Furnaces
  10. Numerical Analysis of Gas Flow Instabilities in Simplified Vertical HVPE GaN Reactors
  11. Statistical investigation of dislocation induced leakage current paths in AlGaN/GaN HEMT structures on Si and the impact of growth conditions
  12. Physically-based, lumped-parameter models for the prediction of oxygen concentration during Czochralski growth of silicon crystals
  13. Numerical forecast of redzone extension in cast silicon ingots in dependence on the purity level of crucible, coating and feedstock
  14. Assessment of residual melt removal as approach to reduce the top redzone of cast silicon ingots
  15. High-Performance n-Type Ge-Free Silicon Thermoelectric Material from Silicon Waste
  16. Factors influencing the gas bubble evolution and the cristobalite formation in quartz glass Cz crucibles for Czochralski growth of silicon crystals
  17. Facet growth and geometry of the growth ridge during dynamic Czochralski processes
  18. Influence of crucible properties and Si3N4-coating composition on the oxygen concentration in multi-crystalline silicon ingots
  19. A Low‐Cost Al‐Graphite Battery with Urea and Acetamide‐Based Electrolytes
  20. A Low‐Cost Al‐Graphite Battery with Urea and Acetamide‐Based Electrolytes
  21. Lifetime limiting defects in 4H-SiC epitaxial layers: The influence of substrate originated defects
  22. Metal contamination of silicon from the furnace atmosphere after crystallization
  23. In-Situ Preparation of GaN Sacrificial Layers on Sapphire Substrate in MOVPE Reactor for Self-Separation of the Overgrown GaN Crystal
  24. Stress evolution in thick GaN layers grown by HVPE
  25. The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors
  26. Solid state diffusion of metallic impurities from crucible and coating materials into crystalline silicon ingots for PV application
  27. Interplay between C-doping, threading dislocations, breakdown, and leakage in GaN on Si HEMT structures
  28. Investigation of gas bubble growth in fused silica crucibles for silicon Czochralski crystal growth
  29. Impact of different SiO2 diffusion barrier layers on lifetime distribution in multi-crystalline silicon ingots
  30. Vertical breakdown of GaN on Si due to V-pits
  31. Considerations on the limitations of the growth rate during pulling of silicon crystals by the Czochralski technique for PV applications
  32. Erlangen—An Important Center of Crystal Growth and Epitaxy: Major Scientific Results and Technological Solutions of the Last Four Decades
  33. Corrigendum to “Particle engulfment dynamics under oscillating crystal growth conditions” [J. Crystal Growth 468 (2017) 24–27]
  34. Production of high performance multi-crystalline silicon ingots for PV application by using contamination-free SixNy seed particles
  35. Deeper insight into lifetime-engineering in 4H-SiC by ion implantation
  36. Theoretical aspects and microstructural investigations on V-pit defects in HVPE grown GaN
  37. Silicon Waste from the Photovoltaic Industry - A Material Source for the Next Generation Battery Technology?
  38. Analysis of the geometry of the growth ridges and correlation to the thermal gradient during growth of silicon crystals by the Czochralski-method
  39. Evaluation of improvement strategies of grain structure properties in high performance multi-crystalline silicon ingots
  40. Methodology for the investigation of threading dislocations as a source of vertical leakage in AlGaN/GaN-HEMT heterostructures for power devices
  41. Thermoelectric properties of silicon and recycled silicon sawing waste
  42. Influence and Mutual Interaction of Process Parameters on the Z1/2 Defect Concentration during Epitaxy of 4H-SiC
  43. Optical Stressing of 4H-SiC Material and Devices
  44. Edge facet dynamics during the growth of heavily doped n-type silicon by the Czochralski-method
  45. A Practical Example of GaN-LED Failure Cause Analysis by Application of Combined Electron Microscopy Techniques
  46. Engulfment and pushing of Si3N4 and SiC particles during directional solidification of silicon under microgravity conditions
  47. Particle engulfment dynamics under oscillating crystal growth conditions
  48. Influence of different nucleation layers on the initial grain structure of multicrystalline silicon ingots
  49. Dislocation formation in heavily As-doped Czochralski grown silicon
  50. A quantitative model with new scaling for silicon carbide particle engulfment during silicon crystal growth
  51. Evolution of grain structure and recombination active dislocations in extraordinary tall conventional and high performance multi-crystalline silicon ingots
  52. Correlation of carbon doping variations with the vertical breakdown of GaN-on-Si for power electronics
  53. Dislocation formation in seed crystals induced by feedstock indentation during growth of quasimono crystalline silicon ingots
  54. Dynamic Modeling of Critical Velocities for the Pushing/Engulfment Transition in the Si-SiC System Under Gravity Conditions
  55. Interaction of SiC particles with moving solid–liquid interface during directional solidification of silicon
  56. Phase-field simulations of particle capture during the directional solidification of silicon
  57. Modelling of Effective Minority Carrier Lifetime in 4H-SiC n-Type Epilayers
  58. Wetting and infiltration of nitride bonded silicon nitride by liquid silicon
  59. Clarification of the relation between the grain structure of industrial grown mc-Si and the area fraction of electrical active defects by means of statistical grain structure evaluation
  60. Influence of different seed materials on multi-crystalline silicon ingot properties
  61. Investigation of iron contamination of seed crystals and its impact on lifetime distribution in Quasimono silicon ingots
  62. Electrically Inactive Dopants in Heavily Doped As-Grown Czochralski Silicon
  63. Investigations of Critical Structural Defects in Active Layers of GaN-on-Si for Power Electronic Devices
  64. Imaging Defect Luminescence of 4H-SiC by Ultraviolet-Photoluminescence
  65. Optical in-situ monitoring system for simultaneous measurement of thickness and curvature of thick layer stacks during hydride vapor phase epitaxy growth of GaN
  66. Nitride bonded silicon nitride as a reusable crucible material for directional solidification of silicon
  67. Response of as grown dislocation structure to temperature and stress treatment in multi-crystalline silicon
  68. Guest Editors' Preface
  69. Defect formation induced by seed-joints during directional solidification of quasi-mono-crystalline silicon ingots
  70. Numerical time-dependent 3D simulation of flow pattern and heat distribution in an ammonothermal system with various baffle shapes
  71. Influence of grain boundaries intentionally induced between seed plates on the defect generation in quasi-mono-crystalline silicon ingots
  72. Preferred grain orientations in silicon ribbons grown by the string ribbon and the edge-defined film-fed growth methods
  73. Laue scanner: A new method for determination of grain orientations and grain boundary types of multicrystalline silicon on a full wafer scale
  74. HCl Assisted Growth of Thick 4H-SiC Epilayers for Bipolar Devices
  75. Comparative study of the luminescence of Al2O3:C and Al2O3 crystals under synchrotron radiation excitation
  76. Experimental verification of the model by Klapper for 4H-SiC homoepitaxy on vicinal substrates
  77. Numerical parameter studies of 3D melt flow and interface shape for directional solidification of silicon in a traveling magnetic field
  78. Step-controlled homoepitaxial growth of 4H–SiC on vicinal substrates
  79. Constitutional Supercooling in Czochralski Growth οf Heavily Doped Silicon Crystals
  80. Non-isothermal model experiments and numerical simulations for directional solidification of multicrystalline silicon in a traveling magnetic field
  81. Combined global 2D–local 3D modeling of the industrial Czochralski silicon crystal growth process
  82. Unsteady coupled 3D calculations of melt flow, interface shape, and species transport for directional solidification of silicon in a traveling magnetic field
  83. Influence of Epilayer Thickness and Structural Defects on the Minority Carrier Lifetime in 4H-SiC
  84. SXRT Investigations on Electrically Stressed 4H-SiC PiN Diodes for 6.5 kV
  85. Systematic characterization of multi-crystalline silicon String Ribbon wafer
  86. Considerations on the Effect of Interstitial and Precipitated Fe in Intentionally Fe-Doped mc-Silicon
  87. Mono-crystalline growth in directional solidification of silicon with different orientation and splitting of seed crystals
  88. Doping induced lattice misfit in 4H–SiC homoepitaxy
  89. Analysis of the growth conditions of long single crystalline basal-plane-faceted sapphire ribbons by the Stepanov/EFG technique
  90. Cathodoluminescence imaging for the determination of dislocation density in differently doped HVPE GaN
  91. Model experiments and numerical simulations for directional solidification of multicrystalline silicon in a traveling magnetic field
  92. Liquid phase epitaxy (LPE) of GaN on c- and r-faces of AlN substrates
  93. 4H-SiC Homoepitaxial Growth on Substrates with Different Off-Cut Directions
  94. Numerical study of the influence of different types of magnetic fields on the interface shape in directional solidification of multi-crystalline silicon ingots
  95. Threading dislocations in n- and p-type 4H–SiC material analyzed by etching and synchrotron X-ray topography
  96. Selective etching of dislocations in GaN grown by low-pressure solution growth
  97. Interactions of Dislocations during Epitaxial Growth of SiC and GaN
  98. About the formation and avoidance of C and N related precipitates during directional solidification of multi-crystalline silicon from contaminated feedstock
  99. Dislocation Conversion and Propagation during Homoepitaxial Growth of 4H-SiC
  100. The influence of growth rate on the formation and avoidance of C and N related precipitates during directional solidification of multi crystalline silicon
  101. Modeling of incorporation of O, N, C and formation of related precipitates during directional solidification of silicon under consideration of variable processing parameters
  102. Low Pressure Solution Growth of Gallium Nitride
  103. Optimization and Modeling of Photovoltaic Silicon Crystallization Processes
  104. Influence of Growth Rate and C/Si-Ratio on the Formation of Point and Extended Defects in 4H-SiC Homoepitaxial Layers Investigated by DLTS
  105. Influence of forced convection on the directional solidification of AlSi alloys: comparison of experiments and simulation
  106. On the influence of solution density on the formation of macroscopic defects in the liquid phase epitaxy of GaN
  107. Numerical study on the prediction of microstructure parameters by multi-scale modeling of directional solidification of binary aluminum–silicon alloys
  108. Influence of Substrate Preparation and Epitaxial Growth Parameters on the Dislocation Densities in 4H-SiC Epitaxial Layers
  109. Reduction of the dislocation density in GaN during low-pressure solution growth
  110. Crystal growth of compound semiconductors with low dislocation densities
  111. The importance of convective heat and mass transfer for controlling material properties in ingot casting of multi-crystalline-silicon for photovoltaic applications
  112. Low-pressure solution growth (LPSG) of GaN templates with diameters up to 3 inch
  113. Yield Improvement and Defect Control in Bridgman‐Type Crystal Growth with the Aid of Thermal Modeling
  114. Simulation of dislocation density: Global modeling of bulk crystal growth by a quasi-steady approach of the Alexander–Haasen concept
  115. Vapor phase growth of GaN using GaN powder sources and thermogravimetric investigations of the evaporating behaviour of the source material
  116. Study on the kinetics of the formation reaction of GaN from Ga-solutions under ammonia atmosphere
  117. Study on the sublimation growth of GaN using different powder sources and investigation on the sublimation behaviour of GaN powder by means of thermogravimetry
  118. 3D time-dependent numerical study of the influence of the melt flow on the interface shape in a silicon ingot casting process
  119. A new hybrid method for the global modeling of convection in CZ crystal growth configurations
  120. Influence of different types of magnetic fields on the interface shape in a 200mm Si-EMCZ configuration
  121. Considerations on facetting and on the atomic structure of the phase boundary in low-pressure solution growth of GaN
  122. Large modification of crystal–melt interface shape during Si crystal growth by using electromagnetic Czochralski method (EMCZ)
  123. Morphologies of GaN single crystals grown from Ga solutions under flowing ammonia
  124. Simulation of ESA's msl Furnace Inserts and Sample-Cartridge Assemblies Using the Thermal Modeling Tool Crysvun
  125. Characterisation of the electrical properties of solution-grown GaN crystals by reflectivity and Hall measurements
  126. Simulation of ESA’s MSL Furnace Inserts and Sample-Cartridge Assemblies: Model Development and Correlation with Experimental Data
  127. Characterisation of GaN crystals and epilayers grown from a solution at room pressure
  128. Modeling of industrial bulk crystal growth—state of the art and challenges
  129. Growth and characterization of 2" and 4" low EPD InP substrate crystals by the vertical gradient freeze (VGF)-method
  130. Study of the oxygen incorporation during growth of large CaF2-crystals
  131. A matrix based correction scheme of the liquid fraction during columnar solidification
  132. Challenges in modeling of bulk crystal growth
  133. Comparative numerical study of the effects of rotating and travelling magnetic fields on the interface shape and thermal stress in the VGF growth of InP crystals
  134. Three-dimensional modeling of melt flow and interface shape in the industrial liquid-encapsulated Czochralski growth of GaAs
  135. Numerical study on directional solidification of AlSi alloys with rotating magnetic fields under microgravity conditions
  136. Numerical study of the effects of rotating magnetic fields during VGF growth of 3'' GaAs crystals
  137. 3D numerical simulation of Rayleigh-Bénard convection in an electrically conducting melt acted on by a travelling magnetic field
  138. Systematic study of the influence of the Czochralski hot zone design on the point defect distribution with respect to a “perfect” crystal
  139. Experimental Verification of the Numerical Model for a CaF2 Crystal Growth Process
  140. Numerical simulation of formation of grain structure and global heat transport during solidification of technical alloys in MSL inserts
  141. Comparison of the predictions from 3D numerical simulation with temperature distributions measured in Si Czochralski melts under the influence of different magnetic fields
  142. On void engulfment in shaped sapphire crystals using 3D modelling
  143. Optical cross-sections and distribution of Fe2+ and Fe3+ in semi-insulating liquid encapsulated Czochralski grown InP:Fe