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  1. Surface Morphology of 4H-SiC after Thermal Oxidation
  2. Analysis of 4H-SiC MOS Capacitors on Macro-Stepped Surfaces
  3. Analysis of Thin Thermal Oxides on (0001) SiC Epitaxial Layers
  4. Dye-injected electron trapping in TiO2 determined by broadband transient infrared spectroscopy