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  1. Broadband vibration energy harvesting using nonlinear multi degree-of-freedom mechanical filters

    Article • Nonlinear Dynamics, February 2025, Springer Science + Business Media

    prof. Fabrizio Bonani

  2. TCAD accurate modeling of trap-induced effects in GaN HEMTs

    Article • January 2025, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  3. Technology CAD for Microwaves: From Devices to Circuit Performance

    Article • IEEE Microwave Magazine, January 2025, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  4. Analysis and Optimization of a Multi-Degree-of-Freedom Energy Harvester for Mechanical Vibrations Based on Coupled Resonators

    Article • December 2024, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  5. A stochastic averaging mathematical framework for design and optimization of nonlinear energy harvesters with several electrical DOFs

    Article • Communications in Nonlinear Science and Numerical Simulation, December 2024, Elsevier

    prof. Fabrizio Bonani

  6. Model order reduction and stochastic averaging for the analysis and design of micro-electro-mechanical systems

    Article • Nonlinear Dynamics, January 2024, Springer Science + Business Media

    prof. Fabrizio Bonani

  7. Circuit Theory Inspired Solutions for Energy Harvesting Applications

    Article • December 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  8. Multibias TCAD Analysis of Trap Dynamics in GaN HEMTs

    Article • November 2023, Springer Science + Business Media

    prof. Fabrizio Bonani

  9. TCAD Analysis of GaN HEMT Output Conductance Through Trap Rate Equation Green’s Functions

    Article • November 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  10. GaN HEMT trap-induced variability through concurrent noise and AC TCAD modelling

    Article • October 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  11. Noise induced oscillations in a second order circuit with nonvolatile memristor

    Article • October 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  12. TCAD analysis of GaN HEMT AC parameters through accurate solution of trap rate equations

    Article • September 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  13. TCAD assisted design of the Doherty Power Amplifier

    Article • Solid-State Electronics, September 2023, Elsevier

    prof. Fabrizio Bonani

  14. Projective embedding of dynamical systems: Uniform mean field equations

    Article • Physica D Nonlinear Phenomena, August 2023, Elsevier

    prof. Fabrizio Bonani

  15. Application of Stochastic Averaging to Vibrating Electro-mechanical Systems for Piezoelectric Energy Harvesting

    Article • July 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  16. Stochastic analysis of a bistable piezoelectric energy harvester with a matched electrical load

    Article • Nonlinear Dynamics, July 2023, Springer Science + Business Media

    prof. Fabrizio Bonani

  17. Spatial distribution of microwave device harmonic electrical variables through T-dependent TCAD simulations

    Article • July 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  18. Stochastic description of a matched-load mechanical energy harvester

    Article • July 2023, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  19. TCAD Modeling of GaN HEMT Output Admittance Dispersion through Trap Rate Equation Green’s Functions

    Article • Electronics, May 2023, MDPI AG

    prof. Fabrizio Bonani

  20. Analysis of Doherty Power Amplifier Matching Assisted by Physics-Based Device Modelling

    Article • Electronics, May 2023, MDPI AG

    prof. Fabrizio Bonani

  21. Moment-Based Stochastic Analysis of a Bistable Energy Harvester with Matching Network

    Article • Applied Sciences, March 2023, MDPI AG

    prof. Fabrizio Bonani

  22. A Circuit Theory Perspective on the Modeling and Analysis of Vibration Energy Harvesting Systems: A Review

    Article • Computation, February 2023, MDPI AG

    prof. Fabrizio Bonani

  23. Multi-bias Thermal X-Parameter Model for Efficient Physics-Based FinFET Simulation in RF CAD Tools

    Article • January 2023, Springer Science + Business Media

    prof. Fabrizio Bonani

  24. Maximizing the Harvested Energy from Mechanical Random Vibrations with a Matching Network: A Stochastic Analysis

    Article • December 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  25. TCAD simulation of microwave circuits: The Doherty amplifier

    Article • Solid-State Electronics, November 2022, Elsevier

    prof. Fabrizio Bonani

  26. TCAD-based Dynamic Thermal X-parameters for PA Self-Heating Analysis

    Article • September 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  27. Bridging the Gap between Physical and Circuit Analysis for Variability-Aware Microwave Design: Power Amplifier Design

    Article • Electronics, September 2022, MDPI AG

    prof. Fabrizio Bonani

  28. Logic gates based on nonlinear oscillators

    Article • July 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  29. Variability-aware MMIC design through multiphysics modelling

    Article • July 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  30. Boosting the performance of energy harvesters subject to white Gaussian vibrations through impedance matching solutions

    Article • June 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  31. An Impedance Matching Solution to Increase the Harvested Power and Efficiency of Nonlinear Piezoelectric Energy Harvesters

    Article • Energies, April 2022, MDPI AG

    prof. Fabrizio Bonani

  32. Thermal modeling of RF FinFET PAs through temperature-dependent X-parameters extracted from physics-based simulations

    Article • April 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  33. Efficient TCAD Temperature-dependent Large-Signal Simulation of a FinFET Power Amplifier

    Article • April 2022, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  34. Bridging the Gap between Physical and Circuit Analysis for Variability-Aware Microwave Design: Modeling Approaches

    Article • Electronics, March 2022, MDPI AG

    prof. Fabrizio Bonani

  35. Efficient TCAD Thermal Analysis of Semiconductor Devices

    Article • IEEE Transactions on Electron Devices, November 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  36. Foreword Special Issue on “New Simulation Methodologies for Next-Generation TCAD Tools”

    Article • IEEE Transactions on Electron Devices, November 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  37. Coupled Oscillator Networks for von Neumann and Non-von Neumann Computing

    Article • October 2021, Springer Science + Business Media

    prof. Fabrizio Bonani

  38. Efficient TCAD Large-Signal temperature-dependent variability analysis of a FinFET power amplifier

    Article • September 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  39. A cascaded two-port network model for the analysis of harmonic chain-based energy harvesters

    Article • September 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  40. On the application of circuit theory and nonlinear dynamics to the design of highly efficient energy harvesting systems

    Article • September 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  41. Low-Noise Techniques [From the Guest Editors' Desk]

    Article • IEEE Microwave Magazine, July 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  42. The Complex World of Oscillator Noise: Modern Approaches to Oscillator (Phase and Amplitude) Noise Analysis

    Article • IEEE Microwave Magazine, July 2021, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  43. Leveraging circuit theory and nonlinear dynamics for the efficiency improvement of energy harvesting

    Article • Nonlinear Dynamics, February 2021, Springer Science + Business Media

    prof. Fabrizio Bonani

  44. Application of Floquet theory to dynamical systems with memory

    Article • Chaos An Interdisciplinary Journal of Nonlinear Science, December 2020, American Institute of Physics

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  45. Modeling of three-terminal heterojunction bipolar transistor solar cells

    Article • September 2020, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  46. PA design and statistical analysis through X-par driven load-pull and EM simulations

    Article • July 2020, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  47. Analysis of influence of nonlinearities and noise correlation time in a single-DOF energy-harvesting system via power balance description

    Article • Nonlinear Dynamics, March 2020, Springer Science + Business Media

    prof. Fabrizio Bonani

  48. Colored Noise in Oscillators. Phase-Amplitude Analysis and a Method to Avoid the itô-Stratonovich Dilemma

    Article • IEEE Transactions on Circuits and Systems I Regular Papers, October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  49. Physically-based statistical analysis of nonlinear circuits through X-parameters

    Article • September 2019, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  50. TCAD analysis of FinFET temperature-dependent variability for analog applications

    Article • September 2019, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  51. Physics-based Analysis to Address Critical Aspects of FinFET Mm-wave Applications: Variability and Thermal Management

    Article • June 2019, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  52. Efficient Sensitivity and Variability Analysis of Nonlinear Microwave Stages Through Concurrent TCAD and EM Modeling

    Article • IEEE Journal on Multiscale and Multiphysics Computational Techniques, January 2019, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  53. Modeling Techniques for Electronic Noise and Process Variability in Nanoscale Devices

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  54. Logic Gates Implementation with Coupled Oscillators

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  55. A Novel TCAD Approach to Temperature Dependent DC FinFET Variability Analysis

    Article • September 2018, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  56. A novel approach to the electro-thermal sensitivity analysis of electron devices through efficient physics-based simulations

    Article • July 2018, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  57. Efficient spectral domain technique for the frequency locking analysis of nonlinear oscillators

    Article • The European Physical Journal Plus, July 2018, Springer Science + Business Media

    prof. Fabrizio Bonani

  58. RF sensitivity analysis of independent-gates FinFETs for analog applications exploiting the back-gating effect

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  59. Kuramoto-like model of noisy oscillators

    Article • September 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  60. Vibration energy harvesting enhancement in systems with modulated noise

    Article • September 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  61. Variability of FinFET AC parameters: A physics-based insight

    Article • International Journal of Numerical Modelling Electronic Networks Devices and Fields, August 2017, Wiley

    prof. Fabrizio Bonani

  62. Multi-Gate FinFET Mixer Variability Assessment Through Physics-Based Simulation

    Article • IEEE Electron Device Letters, August 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  63. A comprehensive technique for the assessment of microwave circuit design variability through physical simulations

    Article • June 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  64. Efficient vibration energy harvesting through noise induced transitions

    Article • June 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  65. Physics-based modeling of FinFET RF variability under Shorted- and Independent-Gates bias

    Article • April 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  66. Concurrent Efficient Evaluation of Small-Change Parameters and Green’s Functions for TCAD Device Noise and Variability Analysis

    Article • IEEE Transactions on Electron Devices, March 2017, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  67. Large-signal variability of microwave power amplifiers through efficient device sensitivity-based physical modeling

    Article • International Journal of RF and Microwave Computer-Aided Engineering, February 2017, Wiley

    prof. Fabrizio Bonani

  68. Physics-based modeling of FinFET RF variability

    Article • October 2016, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  69. Influence of Amplitude Fluctuations on the Noise-Induced Frequency Shift of Noisy Oscillators

    Article • IEEE Transactions on Circuits & Systems II Express Briefs, July 2016, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  70. A novel approach to microwave circuit large-signal variability analysis through efficient device sensitivity-based physical modeling

    Article • May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  71. A Unified Approach to the Sensitivity and Variability Physics-Based Modeling of Semiconductor Devices Operated in Dynamic Conditions—Part I: Large-Signal Sensitivity

    Article • IEEE Transactions on Electron Devices, March 2016, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  72. A Unified Approach to the Sensitivity and Variability Physics-Based Modeling of Semiconductor Devices Operated in Dynamic Conditions. Part II—Small-Signal and Conversion Matrix Sensitivity

    Article • IEEE Transactions on Electron Devices, March 2016, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  73. Phase noise spectrum of oscillators described by Itô stochastic differential equations

    Article • August 2015, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  74. Memcomputing NP-complete problems in polynomial time using polynomial resources and collective states

    Article • Science Advances, July 2015, American Association for the Advancement of Science

    prof. Fabrizio Bonani, Massimiliano Di Ventra

  75. Phase and amplitude dynamics of noisy oscillators described by Itô stochastic differential equations

    Article • May 2015, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  76. Noise in oscillators: a review of state space decomposition approaches

    Article • Journal of Computational Electronics, December 2014, Springer Science + Business Media

    prof. Fabrizio Bonani

  77. Cyclostationary noise modeling of radio frequency devices

    Article • International Journal of Numerical Modelling Electronic Networks Devices and Fields, November 2014, Wiley

    prof. Fabrizio Bonani

  78. Floquet-Based Stability Analysis of Power Amplifiers Including Distributed Elements

    Article • IEEE Microwave and Wireless Components Letters, July 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  79. Dynamic computing random access memory

    Article • Nanotechnology, June 2014, Institute of Physics Publishing

    Yuriy Pershin, prof. Fabrizio Bonani, Massimiliano Di Ventra

  80. Dynamic computing random access memory: A brain-inspired computing paradigm with memelements

    Article • June 2014, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  81. A surface-potential-based MOSFET compact model accounting for random doping fluctuations

    Article • International Journal of Numerical Modelling Electronic Networks Devices and Fields, December 2013, Wiley

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  82. A new numerical approach for the efficient computation of Floquet multipliers within the harmonic balance technique

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  83. A 2D driven brownian particle with memory

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  84. A green's function approach to the analysis of non volatile memory device variability as a function of individual trap position

    Article • June 2013, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  85. Generalized Floquet Theory: Application to Dynamical Systems with Memory and Bloch’s Theorem for Nonlocal Potentials

    Article • Physical Review Letters, April 2013, American Physical Society (APS)

    prof. Fabrizio Bonani

  86. Large-Signal Stability of Symmetric Multibranch Power Amplifiers Exploiting Floquet Analysis

    Article • IEEE Transactions on Microwave Theory and Techniques, April 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  87. Application of Floquet theory to the large signal stability analysis of microwave amplifiers

    Article • April 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  88. RF and Microwave Semiconductor Technologies

    Article • February 2013, Wiley

    prof. Fabrizio Bonani

  89. Selective Determination of Floquet Quantities for the Efficient Assessment of Limit Cycle Stability and Oscillator Noise

    Article • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, February 2013, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  90. Physics-based SS and SSLS variability assessment of microwave devices through efficient sensitivity analysis

    Article • September 2012, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  91. Improved harmonic balance implementation of Floquet analysis for nonlinear circuit simulation

    Article • AEU - International Journal of Electronics and Communications, May 2012, Elsevier

    prof. Fabrizio Bonani

  92. Oscillator Noise: A Nonlinear Perturbative Theory Including Orbital Fluctuations and Phase-Orbital Correlation

    Article • IEEE Transactions on Circuits and Systems I Regular Papers, October 2011, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  93. Modeling and simulation of noise in transistors under large-signal condition

    Article • June 2011, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  94. A rigorous analysis of oscillator noise including orbital fluctuations

    Article • June 2011, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  95. Analytical assessment of orbital noise effects in ring oscillators

    Article • June 2011, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  96. ASYMPTOTIC STOCHASTIC CHARACTERIZATION OF PHASE AND AMPLITUDE NOISE IN FREE-RUNNING OSCILLATORS

    Article • Fluctuation and Noise Letters, June 2011, World Scientific Pub Co Pte Lt

    prof. Fabrizio Bonani

  97. An Improved Methodology for the CAD Optimization of Multiple Floating Field-Limiting Ring Terminations

    Article • IEEE Transactions on Electron Devices, January 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  98. Frequency-domain evaluation of the adjoint Floquet eigenvectors for oscillator noise characterisation

    Article • IET Circuits Devices & Systems, January 2011, the Institution of Engineering and Technology (the IET)

    prof. Fabrizio Bonani

  99. A Generalized Drift-Diffusion Model for Rectifying Schottky Contact Simulation

    Article • IEEE Transactions on Electron Devices, July 2010, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  100. Oscillator noise: a rigorous analysis including orbital fluctuations

    Article • January 2010, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  101. Assessment of Thermal Instabilities and Oscillations in Multifinger Heterojunction Bipolar Transistors Through a Harmonic-Balance-Based CAD-Oriented Dynamic Stability Analysis Technique

    Article • IEEE Transactions on Microwave Theory and Techniques, December 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  102. Assessment of surge current capabilities of SiC-based high-power diodes through physics-based mixed-mode electro-thermal simulations

    Article • December 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  103. HB-based CAD-oriented dynamic stability analysis of circuits and devices: Application to the assessment of thermal instabilities in multifinger HBTs

    Article • June 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  104. A frequency-domain approach to the analysis of stability and bifurcations in nonlinear systems described by differential-algebraic equations (Int. J. Circ. Theor. Appl.(DOI: 10.1002/cta.440))

    Article • International Journal of Circuit Theory and Applications, June 2009, Wiley

    prof. Fabrizio Bonani

  105. Low-frequency noise in nonlinear systems

    Article • IEEE Microwave Magazine, February 2009, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  106. A novel numerical approach for the frequency-domain calculation of oscillator noise

    Article • January 2009, American Institute of Physics

    prof. Fabrizio Bonani

  107. A novel, rigorous approach to the dynamic, large-signal stability analysis of semiconductor devices and circuits under electro-thermal interaction

    Article • December 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  108. Novel TCAD-Oriented Definition of the off-State Breakdown Voltage in Schottky-Gate FETs: A 4H–SiC MESFET Case Study

    Article • IEEE Transactions on Electron Devices, December 2008, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  109. Large‐signal device simulation in time‐ and frequency‐domain: a comparison

    Article • COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, November 2008, Emerald

    prof. Fabrizio Bonani

  110. A critical discussion of the current collapse in multifinger HBTs based on Floquet stability analysis

    Article • November 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  111. When self-consistency makes a difference

    Article • IEEE Microwave Magazine, October 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, Professor Vittorio Camarchia, prof. Fabrizio Bonani

  112. A rigorous assessment of electro-thermal device instabilities via Harmonic Balance modeling

    Article • October 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  113. A rigorous assessment of electro-thermal device instabilities via Harmonic Balance modeling

    Article • October 2008, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  114. A frequency-domain approach to the analysis of stability and bifurcations in nonlinear systems described by differential-algebraic equations

    Article • International Journal of Circuit Theory and Applications, January 2008, Wiley

    prof. Fabrizio Bonani

  115. On the Substrate Thermal Optimization in SiC-Based Backside-Mounted High-Power GaN FETs

    Article • IEEE Transactions on Electron Devices, July 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  116. Application of physical models to circuit simulations

    Article • June 2007, SPIE

    prof. Fabrizio Bonani

  117. Transfer matrix method modelling of inhomogeneous Schottky barrier diodes on silicon carbide

    Article • Solid-State Electronics, March 2007, Elsevier

    prof. Fabrizio Bonani

  118. Innovative techniques for device large-signal noise simulations

    Article • January 2007, American Institute of Physics

    prof. Fabrizio Bonani

  119. Kinetic and Partial-Differential Equation Modeling of Noise in Schottky Barrier Diodes: a Comparison

    Article • January 2007, American Institute of Physics

    prof. Fabrizio Bonani

  120. An efficient numerical technique for the implementation of SSLS and cyclostationary noise analysis in physics-based device simulators

    Article • Journal of Computational Electronics, July 2006, Springer Science + Business Media

    prof. Fabrizio Bonani

  121. Self-consistent coupled carrier transport full-wave EM analysis of semiconductor traveling-wave devices

    Article • IEEE Transactions on Microwave Theory and Techniques, June 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  122. Physics-based mixed-mode reverse recovery modeling and optimization of Si PiN and MPS fast recovery diodes

    Article • Microelectronics Journal, March 2006, Elsevier

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  123. Physics-based Mixer Noise Simulation

    Article • January 2006, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  124. Accurate simulation of travelling-wave electroabsorption modulators through a novel coupled electromagnetic and carrier-transport model

    Article • January 2005, Institute of Electrical & Electronics Engineers (IEEE)

    Dr Federica Cappelluti, prof. Fabrizio Bonani

  125. Low-frequency noise conversion modeling in RF devices under forced nonlinear operation

    Article • International Journal of RF and Microwave Computer-Aided Engineering, January 2005, Wiley

    prof. Fabrizio Bonani

  126. Key issues in trap-assisted low-frequency device noise simulation in nonlinear large-signal conditions

    Article • January 2005, American Institute of Physics

    prof. Fabrizio Bonani

  127. Two-dimensional physics-based low-frequency noise modeling of bipolar semiconductor devices in small- and large-signal operation

    Article • January 2005, American Institute of Physics

    prof. Fabrizio Bonani

  128. Simulation of cyclostationary noise in semiconductor devices

    Article • May 2004, SPIE

    prof. Fabrizio Bonani

  129. Small- and large-signal trap-assisted GR noise modeling in semiconductor devices

    Article • May 2004, SPIE

    prof. Fabrizio Bonani

  130. Compact Conversion and Cyclostationary Noise Modeling of pn–Junction Diodes in Low-Injection—Part I: Model Derivation

    Article • IEEE Transactions on Electron Devices, March 2004, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  131. Compact Conversion and Cyclostationary Noise Modeling of pn–Junction Diodes in Low-Injection—Part II: Discussion

    Article • IEEE Transactions on Electron Devices, March 2004, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  132. Comments on "Noise source modeling for cyclostationary noise analysis in large-signal device operation"

    Article • IEEE Transactions on Electron Devices, October 2003, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  133. Physics-based simulation techniques for small- and large-signal device noise analysis in RF applications

    Article • IEEE Transactions on Electron Devices, March 2003, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  134. Noise source modeling for cyclostationary noise analysis in large-signal device operation

    Article • IEEE Transactions on Electron Devices, September 2002, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  135. A TCAD approach to the physics-based modeling of frequency conversion and noise in semiconductor devices under large-signal forced operation

    Article • IEEE Transactions on Electron Devices, May 2001, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  136. Noise in Semiconductor Devices

    Article • January 2001, Springer Science + Business Media

    prof. Fabrizio Bonani

  137. Analysis of stability and bifurcations of limit cycles in Chua's circuit through the harmonic-balance approach

    Article • IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications, January 1999, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  138. An efficient approach to noise analysis through multidimensional physics-based models

    Article • IEEE Transactions on Electron Devices, January 1998, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  139. Qualitative analysis of the dynamics of the time-delayed Chua's circuit

    Article • IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications, June 1997, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  140. Physics-based large-signal sensitivity analysis of microwave circuits using technological parametric sensitivity from multidimensional semiconductor device models

    Article • IEEE Transactions on Microwave Theory and Techniques, May 1997, Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  141. On the application of the Kirchhoff transformation to the steady-state thermal analysis of semiconductor devices with temperature-dependent and piecewise inhomogeneous thermal conductivity

    Article • Solid-State Electronics, July 1995, Elsevier

    prof. Fabrizio Bonani

  142. An extended fukui-like formula for the minimum-noise figure of microwave fets

    Article • Microwave and Optical Technology Letters, August 1994, Wiley

    prof. Fabrizio Bonani

  143. High-field diffusivity and noise spectra in GaAs MESFETs

    Article • Journal of Physics D Applied Physics, February 1994, Institute of Physics Publishing

    prof. Fabrizio Bonani

  144. A new analytical model for high frequency MOSFET noise

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani

  145. A new dynamic, self-consistent electro-thermal model of power HBTs and a novel interpretation of thermal collapse loci in multi-finger devices

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    prof. Fabrizio Bonani