All Stories

  1. Cathodoluminescence Study of SiO2/4H-SiC Structures Treated with High-Temperature Post-Oxidation Annealing
  2. Improvement of SiO2/4H-SiC Interface Quality by Post-Oxidation Annealing in N2 at High-Temperatures
  3. Study of SiO2/4H-SiC interface nitridation by post-oxidation annealing in pure nitrogen gas
  4. Cathodoluminescence study of radiative interface defects in thermally grown SiO2/4H-SiC(0001) structures
  5. Improved bias-temperature instability characteristics in SiC metal-oxide-semiconductor devices with aluminum oxynitride dielectrics
  6. Degradation of SiO2/SiC Interface Properties due to Mobile Ions Intrinsically Generated by High-Temperature Hydrogen Annealing
  7. Understanding and controlling bias-temperature instability in SiC metal-oxide-semiconductor devices induced by unusual generation of mobile ions
  8. Investigation of unusual mobile ion effects in thermally grown SiO2 on 4H-SiC(0001) at high temperatures
  9. Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC(0001) Si-Face and (000-1) C-Face Substrates
  10. Impact of Interface Defect Passivation on Conduction Band Offset at SiO2/4H-SiC Interface
  11. Synchrotron x-ray photoelectron spectroscopy study on thermally grown SiO2/4H-SiC(0001) interface and its correlation with electrical properties
  12. ENHANCING BIOLOGICAL RELEVANCE OF A WEIGHTED GENE CO-EXPRESSION NETWORK FOR FUNCTIONAL MODULE IDENTIFICATION
  13. (Invited) Gate Stack Technologies for SiC Power MOSFETs
  14. (Invited) Impact of Stacked AlON/SiO
  15. Identifying Functional Modules Using MST-Based Weighted Gene Co-Expression Networks