Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever

  • Nobuo Satoh, Kei Kobayashi, Shunji Watanabe, Toru Fujii, Kazumi Matsushige, Hirofumi Yamada
  • Japanese Journal of Applied Physics, November 2014, Japan Society of Applied Physics
  • DOI: 10.7567/jjap.53.125201

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http://dx.doi.org/10.7567/jjap.53.125201