Depth profiles of the nickel donor center in p-type silicon diffused with dilute nickel measured by deep-level transient spectroscopy

  • Minoru Nakamura, Susumu Murakami, Haruhiko Udono
  • Japanese Journal of Applied Physics, August 2014, Japan Society of Applied Physics
  • DOI: 10.7567/jjap.53.091301

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http://dx.doi.org/10.7567/jjap.53.091301

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