A Review of Test Artifacts for Additive Manufacturing

  • Shawn Moylan, April Cooke, Kevin Jurrens, John Slotwinski, M. Alkan Donmez
  • May 2012, National Institute of Standards and Technology (NIST)
  • DOI: 10.6028/nist.ir.7858

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http://dx.doi.org/10.6028/nist.ir.7858