Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer with a Speed Ratio 1:3

  • Sofyan A. Taya, Taher M. El-Agez, Anas A. Alkanoo
  • Journal of Electromagnetic Analysis and Application, January 2011, Scientific Research Publishing, Inc,
  • DOI: 10.4236/jemaa.2011.39056

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http://dx.doi.org/10.4236/jemaa.2011.39056

The following have contributed to this page: Prof. Sofyan A Taya