What is it about?
In this paper, a low‑noise transimpedance amplifier for pixelated CMOS photon detector for the use in the scanning electron microscope is presented.
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Why is it important?
The TIA was proven experimentally to work at a frequency in excess of 3.5 MHz and produce a transimpedance gain of 127.68 dBΩ.
Perspectives
A good design of CMOS TIA for use in an integrated circuit for the scanning electron microscope.
Dr Joon Huang Chuah
University of Malaya
Read the Original
This page is a summary of: Low-noise transimpedance amplifier for pixelated CMOS photon detector in the scanning electron microscope, IETE Journal of Research, January 2013, Medknow, DOI: 10.4103/0377-2063.116082.
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