Synchrotron X-Ray Study on Crack Prevention in AlN Crystals Grown on Gradually Decomposing SiC Substrates

Tatiana S. Argunova, Mikhail Yu. Gutkin, O.P. Kazarova, E.N. Mokhov, Sergey S. Nagalyuk, Jung H. Je
  • Materials Science Forum, June 2015, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.821-823.1011

Crack-free interface in wafer-bonded Ge/Si by patterned grooves

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.4028/www.scientific.net/msf.821-823.1011

The following have contributed to this page: Jung Ho Je, Dr. Tat S Argunova, and Evgeny Mokhov