Synchrotron X-Ray Study on Crack Prevention in AlN Crystals Grown on Gradually Decomposing SiC Substrates

Tatiana S. Argunova, Mikhail Yu. Gutkin, O.P. Kazarova, E.N. Mokhov, Sergey S. Nagalyuk, Jung H. Je
  • Materials Science Forum, June 2015, Trans Tech Publications
  • DOI: 10.4028/

Crack-free interface in wafer-bonded Ge/Si by patterned grooves

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The following have contributed to this page: Jung Ho Je, Dr. Tat S Argunova, and Evgeny Mokhov