J-Resistance Curve Testing Using Modified Normalization Method for SENT Specimens

Zheng Liu, Xin Wang, Xu Chen
  • Key Engineering Materials, March 2019, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/kem.795.367

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http://dx.doi.org/10.4028/www.scientific.net/kem.795.367

The following have contributed to this page: Xu Chen