Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Growth, Structural and Mechanical Characterization and Reliability of Chemical Vapor Deposited Co and Co3O4 Thin Films as Candidate Materials for Sensing Applications, Key Engineering Materials, November 2011, Trans Tech Publications,
DOI: 10.4028/www.scientific.net/kem.495.108.
You can read the full text:
Contributors
The following have contributed to this page