Fatigue Crack Monitoring Using Image Correlation

Pablo Lopez-Crespo, A. Shterenlikht, Eann A Patterson, J.R. Yates, Philip J. Withers
  • Key Engineering Materials, July 2008, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/kem.385-387.341

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http://dx.doi.org/10.4028/www.scientific.net/kem.385-387.341

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