Full-Field Modelling of Crack Tip Shielding via the ‘Plastic Inclusion’ Concept

M. Neil James, Yan Wei Lu, Colin J. Christopher, Eann A Patterson
  • Advanced Materials Research, June 2010, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/amr.118-120.1

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http://dx.doi.org/10.4028/www.scientific.net/amr.118-120.1

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